Spectrum preview
Title
Co K edge XAS fluorescence of CoFePt deposited on silicium (normal incidence: 5°)
Database
Experiment type
laboratory measurement
Spectrum type
fluorescence emission
Version
#1 (2021-02-09 15:34:48 UTC+0000)
Instrument parameters
Instrument
X-ray Absorption Spectroscopy measured in fluorescence mode
Spectral observation mode
spectrum
Valid spectral range(s)
7580.0 - 8452.0 $eV$
Observation geometry
directional :
Angle observation mode
fixed angles
Spatial observation mode
single spot
Sample preview
Name
CoFePt deposited on silicium
Origin
commercial
Thickness
2.13e-08 $mm$
Temperature
25.0 $\pm$ -268.1 $^{\circ}C$
Pressure
1.0 $atm$
References
Data reference
Paleo, Charles; Le Roy, Damien; Dupuis, Véronique (2018): Co K edge, Fe K edge and Pt L3 edge XAS fluorescence of CoFePt nanocomposite films. SSHADE/FAME (OSUG Data Center). Dataset/Spectral Data. https://doi.org/10.26302/SSHADE/EXPERIMENT_CP_20180418_001
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