- Title
- Pt L3 edge XAS fluorescence of L1₀ CoPt deposited on silicium (normal incidence: 5°)
- Database
- Experiment type
- laboratory measurement
- Spectrum type
- fluorescence emission
- Version
- #1 (2021-02-09 15:34:48+0000 UTC)
- Instrument
- X-ray Absorption Spectroscopy measured in fluorescence mode
- Spectral observation mode
- spectrum
- Valid spectral range(s)
- 11449.0 - 12417.0 eV
- Observation geometry
- directional :
- Angle observation mode
- fixed angles
- Spatial observation mode
- single spot
- Name
- L10 CoPt deposited on silicium
- Origin
- commercial
- Thickness
- 1.53e-08 mm
- Temperature
- 25.0 ± -268.1 ∘C
- Pressure
- 1.0 atm
References
- Data reference
- Paleo, Charles; Le Roy, Damien; Dupuis, Véronique (2018): Co K edge, Fe K edge and Pt L3 edge XAS fluorescence of CoFePt nanocomposite films. SSHADE/FAME (OSUG Data Center). Dataset/Spectral Data. https://doi.org/10.26302/SSHADE/EXPERIMENT_CP_20180418_001
- Publications