- Title
- Pd K edge XAS fluorescence of 1 wt.% Pd/SiO2 at RT under He (after heating at 300C under H2)
- Database
- Experiment type
- laboratory measurement
- Spectrum type
- fluorescence emission
- Version
- #1 (2021-07-20 12:02:02 UTC+0000)
- Instrument
- X-ray Absorption Spectroscopy measured in fluorescence mode
- Spectral observation mode
- spectrum
- Valid spectral range(s)
- 24201.0 - 25204.0 $eV$
- Observation geometry
- directional :
- Angle observation mode
- fixed angles
- Spatial observation mode
- single spot
- Name
- 1 wt.% Pd/SiO2
- Origin
- laboratory, commercial
- Texture
- compact poor grained
- Thickness
- 2.0 $\pm$ 0.5 $mm$
- Temperature
- 25.0 $\pm$ -268.1 $^{\circ}C$
- Pressure
- 1.0 $bar$
- Fluid
-
- $He$ , 100.0%
References
- Data reference
- Ould-Chikh, Samy (2017): Pd K edge XAS fluorescence of 1 wt.% Pd/SiO2 at RT under He or H2 (after heating at 300C under H2). SSHADE/FAME (OSUG Data Center). Dataset/Spectral Data. https://doi.org/10.26302/SSHADE/EXPERIMENT_SOC_20170316_001