Co K edge XAS fluorescence of L1_0 CoPt deposited on silicium (normal incidence: 5°) | FAME

Spectrum

Co K edge XAS fluorescence of $L1_0$ CoPt deposited on silicium (normal incidence: 5°)

Title: Co K edge XAS fluorescence of $L1_0$ CoPt deposited on silicium (normal incidence: 5°)

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Data

Unit: Range: Valid spectral range(s): 61136824.4281038 - 68169978.9005716 eV

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References

DOI

10.26302/SSHADE/EXPERIMENT_CP_20180418_001

Data reference

Paleo, Charles; Le Roy, Damien; Dupuis, Véronique (2018): Co K edge, Fe K edge and Pt L3 edge XAS fluorescence of CoFePt nanocomposite films. SSHADE/FAME (OSUG Data Center). Dataset/Spectral Data. https://doi.org/10.26302/SSHADE/EXPERIMENT_CP_20180418_001

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Owner

Database

FAME

Experimentalists

Spectrum type

Experiment type: laboratory measurement
Type: fluorescence emission
Intensity unit: AU

Instrument #1

Instrument: X-ray Absorption Spectroscopy measured in fluorescence mode
Sample holder: simple holder

Spectral parameters

Standard medium

unknown

Observation mode

spectrum

Spectral range type(s)

hard X

Excitation wavelength

hard X

Valid spectral range(s)

	Min - Max ($eV$)	Sampling ($eV$)	Resolution ($eV$)	Position accuracy ($eV$)	Absorption edge
#1	7580.0 - 8452.0		0.395		$Co$ (K: 7.7089 $keV$)

Comments

The resolution in the above table is the resolution given by the monochromator. The energy was calibrated by measuring the absorption edge of references: Co metallic foil (first maximum of the derivative set at 7709 eV) for Fe and Co K edges and Pt metallic foil (first maximum of the derivative set at 11564 eV) for Pt L3 edge.