Experiment
                
                Co K edge, Fe K edge and Pt L3 edge  XAS fluorescence of CoFePt nanocomposite films
            
        
        
                            
                                
                            
                            
                                Sub-Experiment
                            
                           Co K edge XAS fluorescence of CoFePt nanocomposite films
                        
                    
                    
                    
                    
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Co K edge XAS fluorescence of CoFePt deposited on silicium (normal incidence: 5°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Co K edge XAS fluorescence of CoFePt deposited on silicium (classical incidence: 45°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Co K edge XAS fluorescence of CoFePt deposited on silicium (grazing incidence: 85°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Co K edge XAS fluorescence of L10 CoPt deposited on silicium (normal incidence: 5°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Co K edge XAS fluorescence of L10 CoPt deposited on silicium (grazing incidence: 85°)
                                    
                                
                            
                        
                    
                            
                                
                            
                            
                                Sub-Experiment
                            
                           Fe K edge XAS fluorescence of CoFePt nanocomposite films
                        
                    
                    
                    
                    
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Fe K edge XAS fluorescence of CoFePt deposited on silicium (normal incidence: 5°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Fe K edge XAS fluorescence of CoFePt deposited on silicium (classical incidence: 45°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Fe K edge XAS fluorescence of CoFePt deposited on silicium (grazing incidence: 85°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Fe K edge XAS fluorescence of L10 FePt deposited on silicium (normal incidence: 5°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Fe K edge XAS fluorescence of L10 FePt deposited on silicium (classical incidence: 45°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Fe K edge XAS fluorescence of L10 FePt deposited on silicium (grazing incidence: 85°)
                                    
                                
                            
                        
                    
                            
                                
                            
                            
                                Sub-Experiment
                            
                           Pt L3 edge XAS fluorescence of CoFePt nanocomposite films
                        
                    
                    
                    
                    
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Pt L3 edge XAS fluorescence of CoFePt deposited on silicium (normal incidence: 5°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Pt L3 edge XAS fluorescence of CoFePt deposited on silicium (grazing incidence: 85°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Pt L3 edge XAS fluorescence of L10 CoPt deposited on silicium (normal incidence: 5°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Pt L3 edge XAS fluorescence of L10 CoPt deposited on silicium (grazing incidence: 85°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Pt L3 edge XAS fluorescence of L10 FePt deposited on silicium (normal incidence: 5°)
                                    
                                
                            
                                
                                    
                                    
                                        
                                            Spectrum
                                        
                                        
                                        Pt L3 edge XAS fluorescence of L10 FePt deposited on silicium (grazing incidence: 85°)
                                    
                                
                            
                        
                    
            Layer
            
                
                    
                    
                
            
        
        - Name
 - Fe
 - Order
 - 5
 
- Type of layer
 - other
 - Thickness
 - 1.15e-09 mm
 
- Formation mode
 - EBPVD
 - Temperature
 - 293.0 K
 - Fluid pressure
 - 1.0e-13 bar
 - Comments
 - Deposited by an electron-beam evaporator.