Sample
Name
IOM from unshocked Murchison
Date
2010-01-01
Provider
IPAG
Thickness
10.0 $\pm$ 5.0 ${\mu}m$
Diameter
50.0 ${\mu}m$
Substrate material
type IIa synthetic diamonds
Comments
manual selection under binocular of about 10 IOM fragments of approximate diameter of 50 microns
Temperature
80.0 $\pm$ 10.0 $^{\circ}C$
Temperature max
22.0 $\pm$ 2.0 $^{\circ}C$
Comments
sample prepared and stored, and data acquired under standard temperature and pressure conditions.
Type
vacuum
Fluid pressure
1.0e-06 $\pm$ 5.0e-07 $mbar$
Comments
MATair_lab_wet
Title
Preparation of the sample for IR measurements

Precursors

Matters

Produced sample

Sample
IOM from unshocked Murchison (this sample)
Processing steps
Step Chronology Date Type Process Changes
#1 before layer formation mechanical Manual selection under optical binocular of about 10 IOM fragments of about 50 microns diameter.
#2 during layer formation mechanical Fragments pressed between two diamonds with a mechanical press Fragments crushed down to a thickness of about 10 microns