- Database
- Experimentalists
- Date
- 2013-10-25
- Provider
- Delphine Nna-Mvondo at NASA Ames Research Center
- Thickness
- 0.5 0.2
- Mass
- 0.012 0.001
- Substrate material
- Spectralon-99 (sintered PTFE with 99% directional-hemispheric reflectance in the Vis-NIR)
- Substrate comments
- thick sintered granular and porous layer (40% porosity)
- Comments
- Tholins partially covering Spectralon
The matter of this sample underwent the whole Experiment #1 prior to measurement, but its spectrum did not changed significantly during Experiment #1
- Temperature
- 298.0 3.0
- Comments
- Sample kept at ambient temperature
- Type
- ambient air
- Fluid temperature
- 298.0
- Fluid pressure
- 1.0
- Number
- 1
- Arrangement
- The tholin layer covers only 15% of the Spectralon substrate, which is thus bare over 85% of its surface
- Layers