- Database
- Experimentalists
- Date
- 2011-01-31
- Provider
- Nathalie Carrasco at LATMOS
- Thickness
- 490.0 15.0
- Surface roughness
- 25nm +/- 10nm - might be surestimated
- Substrate material
- MirrIR
- Substrate comments
- MirrIR Low emission microscope plates from Kevley Technology
- Comments
- Homogeneous organic thin film
- Temperature
- 295.0 2.0
- Comments
- Sample kept at ambient temperature
- Type
- ambient air
- Fluid temperature
- 295.0 2.0
- Fluid pressure
- 1.0
- Number
- 1
- Layers
-
- Tholins LATMOS F-IR 98%N2:2%CH4 , 490.0