Sample
Name
SiC, amorphous
Date
1998-01-01
Thickness
65.0 $nm$
Substrate material
silicon
Temperature
300.0 $\pm$ 5.0 $K$
Temperature max
1123.0 $K$
Type
ambient air
Fluid temperature
300.0 $K$
Fluid pressure
1000.0 $mbar$
Number
1
Layers
Title
Production of amorphous SiC

Produced sample

Sample
SiC, amorphous (this sample)
Processing steps
Step Chronology Date Type Process Changes
#1 before layer formation thermal Conversion of the polymer dimethylpolysilane (-Si(CH$_{3}$)$_{2}$)$_{n}$ to polycarbosilane (PCS) (-CH$_{2}$-SiHCH$_{3}$-CH$_{2}$-Si(CH$_{3}$)$_{2}$)$_{n}$
#2 during layer formation thermal Heating a sheet of polycarbosilane on Si substrate to 1123 K and hold for one hour. a thin film of SiC for IR transmission measurements was produced
Comments
To avoid the oxidation of polycarbosilane to silicon oxide all preparational steps were applied in a glove box and the heating procedure was performed under dried argon atmosphere.