Instrument and technique
- Name
- High Energy Resolution Fluorescence Detection X-ray Absorption Spectroscopy
- Type
- X-ray absorption spectrometer
- Name
- BM16 HERFD Si[844]
- Technique
- fluorescence emission
- Comments
- High resolution spectrometer in macro beam $0.25 x 0.15 mm^2$ (HxV). The X-rays scattered by a fixed path of air are measured with Si diodes to obtain the incident intensity.
- Source
- synchrotron - bending magnet
- Source wavelength
- hard X
- Spectral analyzer(s)
- 2-crystal monochromator Si[220]
- Detector(s)
- Si [844] reflection of Si [422] analyser crystals (1m spherically bent) + Si drift diode