Instrument and technique
Name
High Energy Resolution Fluorescence Detection X-ray Absorption Spectroscopy
Type
X-ray absorption spectrometer
Name
BM30B HERFD Si[333]
Technique
fluorescence emission
Comments
High resolution spectrometer in macro beam $0.3 x 0.2 mm^2$ (HxV). The X-rays scattered by a fixed path of air are measured with Si diodes to obtain the incident intensity.
Source
synchrotron - bending magnet
Source wavelength
hard X
Spectral analyzer(s)
2-crystal monochromator Si[220]
Detector(s)
Si [333] reflection of Si [111] crystals (0.5m spherically bent) + Si drift diode